Jonny Ingman, Master of Science in Technology, will defend his doctoral dissertation in the field of Electrical Engineering at LUT on 30th of September at noon, Auditorium 1314. His dissertation is titled Evaluation of Failure Mechanisms in Electronics Using X-ray Imaging.
Professor Rajan Ambat, Technical University of Denmark, Denmark, and Doctor Bálint Medgyes, Budapest University of Technology and Economics, Hungary, will act as opponents. Professor Pertti Silventoinen of LUT University will act as custos.
The dissertation has been published in the Acta Universitatis Lappeenrantaensis research series number 1038 of the university. ISBN 978-952-335-850-8, ISBN 978-952-335-851-5 (PDF), ISSN-L 1456-4491 (Print) ja ISSN 2814-5518 (Online).