Atomic Force Microscopy (AFM) measurements

The new Atomic Force Microscope (AFM) is now in LUT. In collaboration with our chemical engineering scientists the Laboratory of Physics has acquired best on the market instrument "BRUKER Multimode 8" to carry out research in the fields of polymer science, paper technology, semiconductor materials, magnetic superconductors and many others.

AFM is a device to study local properties of the surface at the nano- and even atomic scale. It is based on the Van der Waals interaction between a solid probe tip and a sample surface, and in special arrangements it can be refocused on utilizing the electromagnetic force. Depending on the type of tip-sample interaction it becomes possible to measure local parameters of topography, surface potential, mechanical properties (stiffness, adhesion, deformation), magnetic properties etc.

Few additional modes purchased with the device allows performing the advanced experiments in liquid environment, additional heating/cooling in range -35˚C – 250 ˚C, highest resolution current mapping, investigation of quantitative nanomechanical properties and automated data processing.

These improved options are in high demand both by the basic science and industry. Experiments conducted before in LUT and by private companies in South Karelia region are now backed up. This is possible by this up-to-date microscope and good collaboration with high level scientific group in Ioffe Physico-Technical Institute (Russian Academy of Sciences).